Description
The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
Features
- Large observation window for viewing analysis from a safe distance
- Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987
- Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity
- Automated feature location for fast sample setup
- Choice of analyzer configuration optimized for your application
- Measure nm-scale coatings on features smaller than 50 µm
- Double the analysis throughput of conventional instruments
- Accommodates large samples in a wide range of shapes
- Robust design tested for long-term production use